Cryogenics 36, 231 (1996)

B. Neppert and P. Esquinazi

Abstract

We have measured the resistance of commercial thick-film chip resistors (Dale Type RC550, nominal resistance R = 500 Ohm) as a function of temperature (8 mK < T < 10 K) and magnetic field B < 7 T (for T > 0.3 K) at different orientations between input current, main area and magnetic field. At 30 mK < T < 10 K the temperature dependence of the resistance follows R = A exp (B/T^¼) in agreement with published data for a 1 kOhm thick-film chip resistance. In contrast to previously published studies of similar resistors we measured a resistance that increases approximately linearly with field at T < 1 K and quadratically at higher temperatures. The sensitivity to magnetic fields decreases from (0.8 ± 0.1)% T^-1 at 0.3 K to 0.1% T^-1 above 2 K for B = 1 T.