Interfacial strain effects in epitaxial multiferroic heterostructures of PbZrxTi1−xO3/La0.7Sr0.3MnO3 grown by pulsed-laser deposition

Appl. Phys. Lett. 92, 152506 (2008); doi:10.1063/1.2908037 (3 pages)

Ionela Vrejoiu, Michael Ziese, Annette Setzer, Pablo D. Esquinazi, Balaji I. Birajdar, Andriy Lotnyk, Marin Alexe, and Dietrich Hesse


Ferroelectric PbZrxTi1−xO3 and ferromagnetic La0.7Sr0.3MnO3 films were grown onSrTiO3(100) substrates in order to fabricate multiferroic epitaxial heterostructures. Multilayers of PbZr0.2Ti0.8O3/La0.7Sr0.3MnO3 with 5 nm thin individual layers preserve good magnetic properties and have a transition temperature of ∼ 320 K. The variation of the magnetic coercive field of thin La0.7Sr0.3MnO3 films, sandwiched betweenPbZrxTi1−xO3 films of increasing Zr content in the same epitaxial heterostructure, demonstrates the influence of the interfacial biaxial strain.