EPJ Web of Conferences 40, 15013 (2013)
F. Bern and M. Ziese
Abstract
Good epitaxial growth characteristics make oxide heterostructures of the perovskite family a model system for the study of emerging phenomena at interfaces. Here we report on SrRuO3/SrTiO3 superlattices as well as single films with individual layer thicknesses between two and 20 unit cells fabricated by pulsed laser deposition. Coherent growth of the interfaces was confirmed by X-Ray and high resolution transmission electron microscopy measurements. Special attention is dedicated to the study of the ordinary and anomalous Hall effect. While SrRuO3 single layers as thin as three unit cells and superlattices with individual layer thicknesses above four unit cells show an anomalous Hall effect similar to the bulk and a temperature–independent high field Hall slope, the ultrathin superlattice shows a temperature dependence in the high field Hall slope and opposite sign in the anomalous Hall effect. Additionally, angle dependent magnetotransport was used to obtain structural information.