small 2015
I. Lorite, Y. Kumar, P. Esquinazi, C. Zandalazini, and S. Perez de Heluani
Abstract
The detection of defect-induced magnetic order in single low-dimensional oxide structures is in general diffi cult because of the relatively small yield of magnetically ordered regions. In this work, the effect of an external magnetic fi eld on the transient photocurrent measured after light irradiation on different ZnO samples at room temperature is studied. It has been found that a magnetic fi eld produces a change in the relaxation rate of the transient photocurrent only in magnetically ordered ZnO samples. This rate can decrease or increase with fi eld, depending on whether the magnetically ordered region is in the bulk or only at the surface of the ZnO sample. The phenomenon reported here is of importance for the development of magnetooptical low-dimensional oxides devices and provides a new guideline for the detection of magnetic order in low-dimensional magnetic semiconductors.