X-Ray Diffraction Measurements and Depth Profiling by Secondary Neutral Mass Spectrometry on Epitaxially Grown High-Tc Superconducting Thin Films* Posted on December 1, 1997 by admin Mikrochim. Acta 125, 211 (1997) H. C. Semmelhack, H. Börner, and M. Lorenz Continue reading →
