Evidence of defect-induced ferromagnetism in ZnFe2O4 thin films

Phys. Rev. B 84, 064404 (2011)

C. E. Rodríguez Torres, F. Golmar, M. Ziese, P. Esquinazi, and S. P. Heluani

Abstract

X-ray absorption near-edge and grazing incidence x-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFe2O4 thin films. The spectroscopy techniques are used to determine the nonequilibrium cation site occupancy as a function of depth and oxygen pressure during deposition and its effects on the magnetic properties. It is found that low deposition pressures below 10−3 mbar cause iron superoccupation of tetrahedral sites without Zn2+ inversion, resulting in an ordered magnetic phase with high room-temperature magnetic moment.